Nano Metrology

Nanometrology is one of the field of metrology, concerned with the science of measurement at the nanoscale level. Nanometrology has a important role in order to produce nanomaterials and devices with a reliability and high degree of accuracy in nanomanufacturing. A challenge  in this field is to improve a new measurement techniques and standards to fulfil the needs of future generation advanced manufacturing, which will rely on nanometer scale materials and technologies. The requirements for measurement and characterization of new sample structures and characteristics far exceed the abilities of current measurement science.

  • Atomic force microscopy
  • Scanning tunnelling microscope
  • Electron Microscope
  • Super Resolution Microscopy
  • Nanopatterning
  • Nanoscales

Related Conference of Nano Metrology

June 05-06, 2017

16th World Nano Conference

Milan, Italy
July 31-August 01, 2017

International Conference on Nanobiotechnology

Chicago, Illinois, USA
July 31-August 01, 2017

World Congress on Regulations of Nanotechnology

Chicago, Illinois, USA
August 31-September 01, 2017

19th Nano Congress for Next Generation

Brussels,Belgium
September 14-15, 2017

2nd World Congress and Expo on Graphene & 2D Materials

Edinburgh, Scotland
October 18-19, 2017

15th World Medical Nanotechnology Congress

Osaka, Japan
October 23-24, 2017

International conference on Nano Science and Technology

Orlando, Florida, USA
Nov 13-14, 2017

18th Nanotechnology Products and Expo

Atlanta, Georgia, USA
November 13-14, 2017

19th International Conference on Nanotek and Expo

Atlanta, Georgia, USA

Nano Metrology Conference Speakers

Recommended Sessions

Related Journals

Are you interested in